ICCAD Workshop on Variability Modeling

We’ll present a poster at the IEEE Workshop on Variability Modeling and Characterization at ICCAD on Thursday.

Shiva Raja will be there to show how our FX transistor model and simulation engine can be used to reduce corners in traditional static timing analysis (STA). The paper also shows that setup and hold constraints are not correctly predicted by corner models while statistical FX models provide more accurate results.